HIGHLIGHTS

  • short-wire fixturing technology ensures transportability, repeatability and stability
  • can handle large board sizes, up to 28 in x 24 in
  • innovative design ensures easy maintenance and fixture change
  • single point of contact for your automated in-circuit test (ICT) solution
  • comprehensive in-system suite of boundary scan tools
  • full suite of award-winning Keysight ICT solutions

The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in the Keysight 3070 and i3070 systems.

Short-wire fixture technology eliminates problems commonly found with long-wire fixturing such as noise and deterioration of test stability. This translates into transportable, repeatable, and stable tests on your i3070 Series 5i even if you need to deploy tests halfway across the globe or on different manufacturing sites.

The i3070 Series 5i Inline ICT brings ease of use to the busy line operator and test engineer. All instruments are accessible via the front for easy maintenance.

An array of tools including intelligent fixture identification, board orientation detection, and test plan revision controls are available to help you develop best-in-class automation solutions for testing today’s complex printed circuit board assemblies.

The i3070 Series 5i is fully backward compatible with 3070 and i3070 test programs.

For more information about ICT systems, please visit ICT System - i3070.

Principais especificações

Fixture Actuation
Press Down
Max Node Count
N/A
Max Parallel Testing
4
System Type
Automated Handler
System Width
1800 mm
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Press Down
N/A
4
Automated Handler
1800 mm
Visualizar mais
Fixture Actuation:
Press Down
Max Node Count:
N/A
Max Parallel Testing:
4
System Type:
Automated Handler
System Width:
1800 mm

Interested in a E9986E?

Featured Resources for E9986E 4-Module In-Circuit Test (ICT) System, i367x Series 5i

Case Studies 2024.02.20

Future-Ready ICT Solutions for Enhanced Test Coverage

Future-Ready ICT Solutions for Enhanced Test Coverage

This case study explores a contract manufacturer's adoption of innovative ICT solutions for EV electronic components, amidst the rapid advancements in the EV industry. Facing challenges in accommodating the complexity of Electric Control Units (ECUs), the manufacturer sought a solution to enhance test coverage while preserving investments in existing fixtures. They implemented the E9988GL i3070 Series 7i ICT system, which improved efficiency and maintained a compact footprint. The successful integration led to reduced handling and testing times, empowering the manufacturer to meet deadlines and ensure long-term growth in EV manufacturing.

2024.02.20

Application Notes 2024.01.30

Streamlining In-System Programming

Streamlining In-System Programming

This application note explores the challenges and solutions in implementing In-System Programming (ISP) on densely populated circuit boards. Focusing on Keysight's advanced ICT system, the document discusses upgraded hardware configurations and introduces the ISP OpenTAP plug-in for streamlined test sequence generation. With a simplified approach to test generation and execution, Keysight's solution offers an efficient pathway for ISP integration. This resource serves as a practical guide for test engineers seeking to optimize ISP processes, enhance efficiency, and reduce complexities in programming.

2024.01.30

Application Notes 2024.01.30

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.01.30

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2024.01.25

Quad Density Pin Card for Enhanced Throughput and Reliability

Quad Density Pin Card for Enhanced Throughput and Reliability

This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes crucial. The current limitations of double-density pin cards prompt the development of the QD pin card, which offers 320 test pins on a single board, more than doubling its predecessor's capabilities. The QD pin card not only enhances test pin capacity but also introduces features like built-in discharge circuits and temperature sensors to optimize testing efficiency. Backward compatibility ensures seamless integration with older testing systems, and electronic serial number storage facilitates easy identification and troubleshooting.

2024.01.25

Application Notes 2024.01.24

Advancing Cluster Testing for High-Density PCBA in Automotive Electronics

Advancing Cluster Testing for High-Density PCBA in Automotive Electronics

This application note delves into the dynamic evolution of Printed Circuit Boards (PCBs) and the challenges posed by the advent of multilayered PCBs, particularly in the context of limited test points. It explores the significance of testing these intricate structures and introduces the concept of cluster testing as a solution.

2024.01.24

Application Notes 2024.01.23

Enhanced Short Tests for High Impedance Nodes

Enhanced Short Tests for High Impedance Nodes

This application note introduces an Enhanced Short Test algorithm tailored to tackle the testing challenges associated with high-impedance nodes in Printed Circuit Board Assemblies (PCBAs). Integrated into the Keysight In-Line High-Density In-Circuit Test (ICT) system, the Enhanced Short Test significantly boosts the efficiency of short detection for high-impedance nodes, leading to a noteworthy 57% reduction in testing time. High-impedance nodes, commonly found in modern PCBAs to enhance signal quality and reduce power consumption, present difficulties such as extended stabilization times, heightened sensitivity, diminished current flow, intricate isolation procedures, and concerns regarding signal stability.

2024.01.23

Application Notes 2024.01.10

Enhancing Supercap Testing in Automotive Electronics

Enhancing Supercap Testing in Automotive Electronics

This application note explores advancements in supercapacitor testing within automotive electronics, focusing on the seamless integration of Electronic Load (ELoad) and Source Measure Unit (SMU) technologies in an In-Circuit Tester.

2024.01.10

Application Notes 2024.01.08

Implementing Precision Low-Current Measurement in In-Circuit Testing

Implementing Precision Low-Current Measurement in In-Circuit Testing

This application note addresses the evolving landscape of the automotive industry, which increasingly relies on sophisticated electronic components. Ensuring the reliability of these components is paramount, and this document focuses on the critical role of precision low-current measurement in achieving this goal. The content explores the significance of low-current measurements in automotive Electronic Control Units (ECUs) and outlines the complexities associated with such measurements. Common approaches to low-current measurement are discussed to provide a comprehensive understanding of the challenges faced in the automotive electronics domain. In response to these challenges, the application note introduces a groundbreaking solution—a new In-Circuit Tester capable of seamlessly integrating Source Measure Units (SMUs). This innovation streamlines the low-current measurement process during the in-circuit test stage, offering enhanced precision and efficiency in automotive electronics testing.

2024.01.08

Application Notes 2023.11.06

i3070 In-Circuit Test System: Transitioning from 662xA to N6700 Series MPS

i3070 In-Circuit Test System: Transitioning from 662xA to N6700 Series MPS

This application note delves into the significant disparities between the Keysight 662xA and N67xx DUT power supplies, specifically in the context of the Keysight i3070 In-Circuit Test (ICT) system. It aims to facilitate the seamless migration of existing programs or the development of new ones for the N67xx series by providing in-depth technical insights. The N67xx Modular Power System offers enhanced features and capabilities, including power ratings and adjustable slew rates. Understanding these technical nuances is pivotal for a smooth transition and unlocks new possibilities for diverse applications.

2023.11.06

Case Studies 2022.11.10

10% Increase in ADAS PCBA Testing Throughput

10% Increase in ADAS PCBA Testing Throughput

Automotive electronics manufacturers must be prepared to address new test challenges efficiently and effectively as advanced driver assistance systems (ADAS) technology advances. This case study shows how an automotive electronics manufacturer used the Keysight in-line 4 module ICT and PathWave Manufacturing Analytics Software to cut down on labor-intensive tasks and increase test throughput.

2022.11.10

Case Studies 2020.01.06

PCBA Manufacturer Shifts Gears for Autonomous Driving with Keysight ICT

PCBA Manufacturer Shifts Gears for Autonomous Driving with Keysight ICT

Leading printed circuit board assembly manufacturer tests 15 million automotive boards with almost no downtime, exceeding its test target.

2020.01.06

Case Studies 2019.10.31

Increase Throughput with i3070 Advanced Throughput Multiplier

Increase Throughput with i3070 Advanced Throughput Multiplier

Learn how Keysight i3070 Advanced Throughput Multiplier helped an EMS company shorten test cycle time by 44% and increased production throughput by 1.8x.

2019.10.31

Case Studies 2019.09.19

Enhancing Automotive Manufacturing Agility to Keep Pace

Enhancing Automotive Manufacturing Agility to Keep Pace

Demand for advanced automotive systems is driving change in electronic design. Keysight helped a major PCBA manufacturer get ready for their automotive future.

2019.09.19

Case Studies 2019.06.03

Reducing Time to Market with PathWave Manufacturing Analytics

Reducing Time to Market with PathWave Manufacturing Analytics

See how Keysight’s PathWave Manufacturing Analytics helped reduce engineering time, enabling one EMS manufacturer to reduce time to market by 6 months.

2019.06.03

Case Studies 2019.05.21

Automotive Electronics Manufacturer Quadruples Throughput

Automotive Electronics Manufacturer Quadruples Throughput

Using the Keysight i3070 4-Module In-Circuit Test System, one automotive electronics manufacturer increased test throughput more than 50%. Learn more!

2019.05.21

Case Studies 2017.11.30

VTEP Goes Head-to-Head with Keysight TestJet

VTEP Goes Head-to-Head with Keysight TestJet

Find how vectorless test EP (VTEP) improves ICT coverage up to 80 percent with TestJet. See test results conducted in Keysight’s R&D lab.

2017.11.30

Case Studies 2017.07.09

i3070 Inline ICT Improves Functional Test Yield of SSDs

i3070 Inline ICT Improves Functional Test Yield of SSDs

Find out how one customer improved function test yields after installing the i3070 Series 5 Inline ICT system.

2017.07.09

Case Studies 2014.07.31

In-Circuit Tester – N5747A High-Power Power Supply

In-Circuit Tester – N5747A High-Power Power Supply

This paper discusses how the implementation of N5747A high-power power supply on a networking board project helps in cost saving of a power supply module.

2014.07.31

Case Studies 2014.07.31

In-Circuit Test Channel Partner Interview

In-Circuit Test Channel Partner Interview

Bob Bower, an industry expert in ICT programming discusses how their company was able to offer better solutions by having a channel partnership with Keysight.

2014.07.31

Case Studies 2014.07.30

Throughput Comparison Between Medalist i3070 Series 5 and Predecessor i3070 In-Circuit Test Systems

Throughput Comparison Between Medalist i3070 Series 5 and Predecessor i3070 In-Circuit Test Systems

The new Medalist i3070 Series 5 in-circuit tester has several new features that enable manufacturers to speed up their tests when compared with using the older i3070 series.

2014.07.30

Case Studies 2014.07.30

In-Circuit Test Chanel Partner Interview Series

In-Circuit Test Chanel Partner Interview Series

Navigating ICT challenges requires a synergy with fixture and programming houses. Everett Charles new boundary scan improve measurably with Keysight ICT solutions.

2014.07.30

Case Studies 2014.07.30

Utilizing Limited Access Tools on ICT System

Utilizing Limited Access Tools on ICT System

Explore the seven most effective limited access tools on the Medalist i3070 ICT system to help tackle complex and shrinking printed circuit board assemblies.

2014.07.30

Case Studies 2014.07.30

Cover-Extend Technology for In-Circuit Test

Cover-Extend Technology for In-Circuit Test

Explains how Cover-Extend Technology helps to enable test access for situations where test access becomes limited with usage of high complexity components.

2014.07.30

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