DS1103A/04A Fault Injection Laser Microscope User Manual

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The Fault Injection Laser Microscope is a workbench for optical fault injection (FI) attacks on semiconductors using a laser. The workbench consists of a microscope which can be mounted on a XYZ stage. A laser unit should be mounted on top of the microscope and laser light is inserted into the optical path of the microscope. Laser light is aimed and guided through an optional spot size reducer, a beam splitter, and an objective to a spot area on the target. A 5x objective is delivered as part of the package.

Objectives for 20x and 50x magnification can be purchased separately. The microscope has a side Near-InfraRed (NIR) camera for visual confirmation of the laser spot on the target. An IR ring light provides additional illumination for the top camera view. The position of the Fault Injection Laser Microscope should be controlled via an additional XYZ-stage. The XYZ stage controls the position of the laser spot on the target via XY stages and focus of image and laser spot via Z stage. The laser spot and camera image are both in focus simultaneously when adjusting the height.

In this user manual, learn the following information:

What’s in the box
Safety instructions
What it does
How to build the setup
Verification of the setup
Help and troubleshooting
Technical specifications