Polarization Dependent Loss (PDL) Measurement
アプリケーションノート
This Keysight Technologies, Inc. application note discusses methods of polarization dependent loss (PDL) measurements, particularly PDL measurements using a waveplatetype polarization controller and Mueller-Stokes analysis.
The discussion includes the mathematical derivation and the achievable accuracy. An extension of this technique for the characterization of integrated optics components is also mentioned.