Accurate and Efficient LIV Testing of VCSELs for 3D Sensing
アプリケーションノート
The integration of 3D sensing and imaging capabilities into various applications, such as consumer electronics, medical, industrial, commercial robotics, automotive, aerospace, and defense, has driven the growth of the global 3D sensing and imaging market. VCSELs are well-proven laser sources for 3D sensor illumination, offering advantages like low cost, wavelength stability over temperature, and optical efficiency within a small footprint. The LIV test is a fundamental measurement to determine the operating characteristics of optical devices such as Laser Diodes (LDs) and VCSELs. This application note explains the challenges of LIV testing and how a precision Source/Measure Unit (SMU) can overcome these test challenges. It shows LIV measurement examples using the Keysight B2900C/CL Series and explains how to synchronize multiple B2900C/CL Series units for advanced testing.