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Notas de Aplicação
Balancing the tradeoffs between performance, speed, and repeatability
Even though most RF and microwave test systems measure devices within a few broad categories— amplifiers, transmitters, receivers—every individual system faces a unique set of circumstances, requirements and challenges. As unique as each situation may be, three universal factors interact when you define any RF and microwave test system: performance, speed and repeatability. Within the unique situation each system developer faces, the ability to make tradeoffs between these factors is one key to achieving the required level of measurement integrity.
Opportunities to manage these tradeoffs can occur at many points along the pathways between the device under test (DUT) and the measurement instruments (Figure 1). This application note suggests a framework for those tradeoffs and offers six sets of hints that address common problems that may exist along RF signal pathways.
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