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Non-Destructive Analysis and EM Model Tuning of PCB Signal Traces using the Beatty Standard

白皮書

The Beatty standard has been gaining attention from the high-speed digital printed circuit board (PCB) community as an approach to obtain PCB signal trace and dielectric material parameters for PCB manufacturing verification and measurement based modeling [1,2]. This is especially critical for test and measurement applications where only a single PCB might be manufactured and destructive physical analysis like cross sectioning is not possible. The simple resonant Beatty test structure can be easily placed anywhere on the PCB and together with an additional structure for connector de-embedding provides non-destructive analysis of the PCB fabrication.

In this paper we will introduce the different Beatty standard implementation topologies including single ended and differential series resonant structures. Measured results from the Beatty test structures can then be used to run a model optimization procedure that tunes for as-fabricated material properties to match with measured results. The significance of PCB test fixture de-embedding will also be addressed for accurate high frequency material properties. The end result of the paper is to provide a step-by-step procedure for a PCB designer wishing to use and implement the Beatty standard on his next board turn.

The step-by-step procedure will then be applied to three different Beatty PCB test structures: stripline, microstrip, and differential microstrip. Each implementation will be evaluated by comparing measurement with the design data sheet simulation, and the optimized as-fabricated measurement-based-model simulation. Cross sections of the PCB test coupons containing the structures were also performed for further comparison of the obtained results.

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