자세히 알아보기
segmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110asegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:product-lines/1h,keysight:models/pz/pz2100a,keysight:models/pz/pz2131a,keysight:models/pw/pw9251a,keysight:models/px/px0101a,keysight:models/px/px0106a,keysight:models/px/px0110a
광학 장치에 DC 공급 방법
고도로 통합된 광학 디바이스를 테스트하려면 의도하지 않은 파장 이동을 방지하기 위해 매우 미세한 바이어스 스위핑 단계가 있는 상당수의 정밀 바이어스 소스가 필요합니다. 더 빠른 스위핑을 가능하게 하고 신호 무결성 문제를 완화하기 위해 각 스위프 단계의 지속 시간을 최소화하는 방법을 알아보십시오.
자세히 알아보기