All Software Catalog

• fully error-corrected time-domain reflection or transmission response
• gating available to remove unwanted responses (e.g., from test fixtures)
• transform frequency domain to the time domain or time domain to the frequency domain
• beneficial in tuning many filter types, including cavity-resonator filters

The time-domain capability allows you to measure the time-domain response of a device. The analyzer can transform frequency-domain data to the time domain or time-domain data to the frequency domain.

The transform used by the analyzer resembles time-domain reflectometry (TDR) measurements. TDR measurements, however, are made by launching an impulse or step into the test device and observing the response in time with a receiver, similar to an oscilloscope. In contrast, the analyzer makes swept frequency response measurements and mathematically transforms the data into a time-domain reflectometer-like display.

• Complete test suites for HDMI: HDMI1.4, HDMI2.1 TMDS (previously HDMI2.0), HDMI 2.1 Fixed Rate Link, HDMI 2.2 Fixed Rate Link, Direct-Attach devices.
• Supports waveform storage for post-processing on scope or offline on a PC.
• Device capability entry using resolution and timing descriptors, video identifier codes (VIC) as well as FRL features
• Automated test sequencing for given test connection
• Full device automation using optional switch network
• Guided connection and instructions throughout the test process
• Test report including system, connection details, summary table, with hotlinks to ancillary test result data, and screen shots of the test measurements
• Tabular final results page with statistical analysis

The D9021HDMC electrical performance validation and compliance software for HDMI transmitter supporting Infiniium V, Z and UXR-Series oscilloscopes gives you a fast and easy way to verify and debug your High Definition Multi-media Interface (HDMI) designs for set-top boxes, Digital Video Recorders, DVD players, and motherboard systems. The HDMI compliance test software lets you automatically execute HDMI electrical checklist tests and displays the results in a comprehensive report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test.

This software supports post processing of waveforms to greatly improve productivity. Post processing can be done on the oscilloscope after waveforms have been acquired or on a PC with a licensed compliance application using Infiniium Offline D9010BSEO. Other required components for solution are: a test point adapter with HDMI plug (TPA-P), probe amplifiers and probe heads, high quality matched cables, and an EDID and SCDC controller device.

HDMI2.1 TMDS (formally HDMI2.0) HDMI2.1 FRL and HDMI2.2 FRL require single-ended connections for single-ended measurements as well as for TP2 differential measurements. Keysight probe and switching offerings include N7010A active termination adapters for the lowest cost connection or N7003A Infiniimode amplifiers with internal switches to enable one connection full FRL testing. Full automation for complete testing of all HDMI versions for a device is possible with switch matrix solution which requires a mainframe and switch modules. To learn more about Keysight’s automated switching solution, visit www.keysight.com/find/switching.

• PCI Express TX analysis of PCIe 5.0 Signals at speeds up to 32 GT/s
• Uncorrelated Jitter, Preset Testing, Uncorrelated PWJ and more
• Configurable pass/fail margin reporting
• HTML Summary Report

Use the PCIe 5.0 Tx compliance software to test, debug and characterize your PCIe Gen5 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report upon test completion. The application compares the results with the specification test limit and includes margin analysis which indicates how closely the device passes or fails each test. With the option InfiniiSim Waveform Transformation Toolset, the software supports integrated de-embedding of the breakout channel of the test fixture.

Jitter Analysis Provides

• Automatic setup wizard for creating jitter histograms, trends, and spectrums
• Automatic setup wizard for RJ/DJ separation via multiple algorithms, pattern lengths, BER levels
• Multiple clock recovery methods
• Calibration to remove RJ from oscilloscope
• Composite histograms and graphs of separated RJ, PJ, DJ, DDJ, DCD and ISI jitter subcomponents
• Composite histograms and graphs of separated TI, DDI, PI, ISI noise subcomponents
• Spectral and noise BER bathtubs

Phase Noise Analysis Provides

• Plotting Single Side Band (SSB) phase noise as log frequency vs dBc/Hz
• Using 2 channels and cross-correlation to reduce broadband measurement noise.
• Measure phase noise of differential clocks with reduced broadband measurement noise.
• Measure phase noise of spread-spectrum modulated clocks.
• Reduce broadband noise (RJ) in cross-correlated time interval error (TIE) measurements.
• Measure integrated jitter between two frequencies on phase noise plot.
• Measure phase noise in circuit with InfiniiMax probes.

With faster edge speeds and shrinking data valid windows in today's high-speed digital designs, insight into the causes of jitter has become critical for success. This jitter analysis software, combined with Keysight's Infiniium 90000, V-, Z- or UXR-Series oscilloscopes, is a key tool for identifying and quantifying jitter components that affect the reliability of your design. Time correlation of jitter to the real-time signal makes it easy to trace jitter components to their sources. Additional compliance views and a measurement setup wizard now simplify and automate RJ/DJ separation for testing against industry standards.

This software automatically detects embedded clock frequencies and repetitive patterns of the data on the oscilloscope inputs and calculates the level of data-dependent jitter (DDJ) that is contributed to the total jitter (TJ) PDF by each transition in the pattern. It also comes with both spectral and tail-fit jitter separation algorithm.

Every waveform is different. As a result, having the flexibility of multiple jitter separation solutions means better answers for each individual waveform. Use the new tail-fit algorithm to properly identify and measure aperiodic bounded uncorrelated jitter, which is especially useful if the waveform is being influenced by cross-talk.

The phase noise analysis feature measures phase noise in a clock source. Phase noise measurement results are presented in a log frequency plot where the amplitude units are dBc/Hz (decibels relative to the carrier power normalized to a 1 Hz bandwidth). Phase noise is one of the most important figures of merit of a signal generating device and can be a limiting factor in a mission-critical application within aerospace and defense, as well as in communications.

Today's high-speed digital designs require insight into the causes of jitter. Phase noise, one of the most important figures of merit of a signal generating device, can be a limiting factor in mission-critical applications like aerospace and defense communications.

This software helps you perform jitter, vertical, and phase noise analysis with Keysight's Infiniium 9000, S-Series, EXR-Series, MXR-Series oscilloscopes.

Time correlation of jitter to the real-time signal helps you easily trace jitter components to their sources. Additional compliance views and a measurement setup wizard now simplify and automate RJ/DJ separation for testing against industry standards.

This software automatically detects embedded clock frequencies and repetitive patterns of the data on the oscilloscope inputs and calculates the level of data-dependent jitter (DDJ) that is contributed to the total jitter (TJ) PDF by each transition in the pattern. It also comes with both spectral and tail-fit jitter separation algorithm. Since every waveform is different, multiple jitter separation solutions give you better answers for each individual waveform. Use the new tail-fit algorithm to properly identify and measure aperiodic bounded uncorrelated jitter, which is especially useful if the waveform is being influenced by cross-talk.

The Phase Noise analysis feature measures phase noise in a clock source. Get measurement results presented in a log frequency plot where the amplitude units are listed in units of dBc/Hz (decibels relative to the carrier power normalized to a 1 Hz bandwidth).

Jitter Analysis Provides

• Automatic setup wizard for creating jitter histograms, trends, and spectrums
• Automatic setup wizard for RJ/DJ separation via multiple algorithms, pattern lengths, BER levels
• Multiple clock recovery methods
• Calibration to remove RJ from oscilloscope
• Composite histograms and graphs of separated RJ, PJ, DJ, DDJ, DCD and ISI jitter subcomponents
• Composite histograms and graphs of separated TI, DDI, PI, ISI noise subcomponents
• Spectral and noise BER bathtubs

Phase Noise Analysis Provides

• Single Side Band (SSB) phase noise plots as log frequency vs. dBc/Hz
• Two channels and cross-correlation to reduce broadband measurement noise
• Differential clocks with reduced broadband measurement noise
• Spread-spectrum modulated clocks
• Broadband noise (RJ) reduction in cross-correlated time interval error (TIE) measurements
• Integrated jitter measurements between two frequencies on phase noise plot
• In circuit with InfiniiMax probes

• Provides nonlinear DUT behavior (EVM, NPR, and ACPR) under modulated stimulus conditions
• Vector error correction and VNA calibration reduce error and provide very low residual system EVM
• Frequency coverage up to 50 GHz
• Coherent measurements with multiple receivers provide fast measurements

S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

A signal generator connected to the PNA-X provides the modulated stimulus. Supported signal generators: VXG (M9383B/84B), M9383A, PSG + M8190A, MXG, or UXG with U3039ACK1

Learn more about Microwave Signal Generator (VXG).

• The fastest throughput oscilloscope solution for triggering on and analyzing automotive serial buses using hardware-based architecture
• On-screen serial decode time-correlated with the serial data waveform
• CAN eye-diagram mask testing - easily download multi-region masks and setups based on industry standards
• Detailed pass / fail statistics from mask tests
• This package enables CAN, CAN FD, LIN, FlexRay, SENT, PSI5 (user-definable Manchester), user-definable NRZ, and CXPI serial trigger and decode, along with mask testing and frequency response analysis (Bode plot). Advanced math already comes standard on all 6000 X-Series oscilloscopes
• CAN and CAN FD symbolic trigger and decode with .dbc file
• LIN symbolic trigger and decode with .ldf file

The automotive software package for Keysight’s InfiniiVision 6000 X-Series oscilloscopes enables protocol triggering and decode for a broad range of the most common automotive serial buses used today for power train and body control and monitoring. This package also enables other advanced analysis capabilities including eye-diagram mask testing and frequency response analysis to help test and debug automotive electronic systems.

• Compliance testing of clock jitter, electrical and timing measurements in accordance to JEDEC specifications
• Comprehensive analysis that automates the complex measurements, even when you are not there
• JEDEC test measurement with navigation capability for DDR Debug
• Statistical analysis on read and write data for margin testing
• Data analytics capabilities which include data import into data repository server and aggregate test results viewing

Use the DDR4 and LPDDR4 application to test, debug and characterize your DDR4 and LPDDR4 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report at the end of the test. The application not only compare the results with the specification test limit but also includes margin analysis which indicates how closely the device passes or fails each test. In addition, the complex analysis of the DDR4 and LPDDR4 signals is taken cared by the application which saves user time and effort if the measurements are done manually.

• Generates dual I/Q signals (BPSK …. QAM256) with flexible signal parameters (e.g. pulse shape, delay) from up to 8 GSym per I/Q pair
• High symbol rate signals up to 50 GBaud with M8196A, up to 75 GBaud with M8196A, and up to 100 GBaud with M8194A
• Option RSP (real-time signal processing) in conjunction with the M8195A enables to change signal parameters (e.g. pulse shape, delay) on the fly at runtime, without the need to download a new waveform
• Option OSP in conjunction with the M8195A, M8196A, or the M8194A provides the ability to synthesize optical signal properties

     - Phase noise (laser line width)

     - Polarization control (polarization rotation > 1000 krad/s)

     - Static polarization mode dispersion (PMD) up to 218 ps (differential group delay) and > 11,000 ps2 (2nd order PMD)

     - With option RSP in conjunction with the M8195A the optical signal properties can be changed in real-time

The Optical Modulation Generator Software 81195A introduces a new approach to optical test. Combined with the M8195A AWG it speeds up your test by a factor of up to 100 with its unique real-time mode. This helps design engineers of long-haul, metro and data-center interconnect coherent optical transmission applications to maximize test efficiency and thus reduce development time and cost.

The 81195A generates dual-I/Q signals for polarization-multiplexed coherent signal transmission test with defined signal parameters and optical signal properties. In conjunction with the M8195A 4-channel AWG it generates transmission signals with up to 32 GBaud and up to 8 GSym per channel using a single M8195A module in real-time encoding mode (option RSP).

The option OSP allows the user to deterministically emulate optical signal properties and receiver stress conditions (incl. phase noise, polarization rotation, and polarization mode dispersion) on the M8195A, the M8196A, or the M8194A AWG. In combination with option RSP, the parameters of these signal properties can be changed on the fly on the M8195A, without the need to download a new waveform.

For more information about pulse generator, please visit Keysight Pulse Generator Product.