Explore the complete portfolio of Keysight software, from design engineering tools to emulator and instrument software, built to extend and enhance your Keysight instruments. Whether you are configuring measurements, automating tests, analyzing data, or validating compliance, use the filters below to identify the right software to support your workflow — from design and validation through manufacturing and deployment.

Pathwave test software

Showing 12 of 1306

Image of  FlexDCA Sampling Oscilloscope Software
FlexDCA Sampling Oscilloscope Software
Model
N1010A

The FlexDCA Sampling Oscilloscope Software N1010A runs Keysight’s digital communication analyzer (DCA) of sampling oscilloscopes with a new user interface.

Image of  Materials Measurement, Resonant Cavity Method for Split Cylinder Resonators
Materials Measurement, Resonant Cavity Method for Split Cylinder Resonators
Model
N15007A

N15007A Resonant cavity method for split cylinder resonators software enables you to evaluate the permittivity characterization of a thin film using the cylindrical cavity fixture.

Image of  Materials Measurement, Parallel Plate/Inductance Method up to 120 MHz
Materials Measurement, Parallel Plate/Inductance Method up to 120 MHz
Model
N15006A

N15006A Parallel plate/inductance method software enables you to evaluate permittivity and permeability characteristics of a thin sheet of materials with E4990A impedance analyzer and E4980 LCR meter.

Image of  Materials Measurement, Parallel Plate/Inductance Method up to 1 GHz
Materials Measurement, Parallel Plate/Inductance Method up to 1 GHz
Model
N15005A

N15005A Parallel plate/inductance method software enables you to evaluate permittivity and permeability characteristics of a thin sheet of materials with E4991B impedance analyzer.

Image of  Materials Measurement, Coaxial Probe Method
Materials Measurement, Coaxial Probe Method
Model
N15004A

N15004A Coaxial probe method software enables you to evaluate the dielectric characteristics of the liquid or semi-solids materials with N1501A dielectric probe.

Image of  Materials Measurement, Resonant Cavity Method
Materials Measurement, Resonant Cavity Method
Model
N15003A

N15003A Resonant cavity method software enables you to characterize the thin films, substrate materials and other low loss dielectric materials by the resonant cavity method.

Image of  Materials Measurement, Arch Reflectivity Method
Materials Measurement, Arch Reflectivity Method
Model
N15002A

N15002A Arch reflectivity method software enables you to characterize the dielectric and magnetic characteristics by the arch reflectivity method.

Image of  Materials Measurement, Transmission Line and Free Space Method
Materials Measurement, Transmission Line and Free Space Method
Model
N15001A

N15001A Transmission line and free space method software enables you to characterize your material's permittivity and permeability characteristics by the transmission line or free space method.

Image of XR3-class Oscilloscope, HD3 Ethernet Application Software
XR3-class Oscilloscope, HD3 Ethernet Application Software
Model
HD300ETHA

Ethernet 10/100 Base-T triggering and analysis for the InfiniiVision HD3 series oscilloscope.

Image of XR3-class Oscilloscope, Automotive Analysis Software for HD3
XR3-class Oscilloscope, Automotive Analysis Software for HD3
Model
HD300AUTB

CAN, CAN FD, and LIN triggering and decoding for the InfiniiVision HD3 Series oscilloscopes.

Image of  WLAN 802.11a/b/g/j/p/n/af/ah Measurement Application, Multi-Touch UI
WLAN 802.11a/b/g/j/p/n/af/ah Measurement Application, Multi-Touch UI
Model
N9077EM0E

Perform WLAN 802.11a/b/g/j/p/n/af/ah transmitters one-button measurements with pass/fail tests as defined by IEEE WLAN 802.11 standards.

Image of  WLAN 802.11ac / ax Measurement Application, Multi-Touch UI
WLAN 802.11ac / ax Measurement Application, Multi-Touch UI
Model
N9077EM1E

Perform WLAN 802.11ac and 802.11ax transmitters one-button measurements with pass/fail tests as defined by IEEE WLAN 802.11 standards.

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