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N15003A Materials Measurement, Resonant Cavity Method
Resonant Cavity method to evaluate permittivity characteristics
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N15003A Resonant cavity method software enables you to characterize the thin films, substrate materials and other low loss dielectric materials by the resonant cavity method.
Highlights
- Automates complex permittivity measurement by calculating the resonant frequency and Q parameters measured by a Keysight Vector Network Analyzer.
- Frequency: 1 GHz to 15 GHz.
- Multiple charts and traces aid in data analysis.
- Offline mode enables you to do the data analysis on your PC.
- Measurement report available to share the results to others.
Keysight N15003A Resonant Cavity method allows you to evaluate the permittivity characteristics of your thin films, substrate materials, and other low loss dielectric materials using a resonant cavity fixture. This method uses a network analyzer to measure resonant frequency and Q of a resonant cavity fixture, first empty and then loaded with the material under test (MUT). Permittivity can then be calculated from these measurements. The measurement frequency range is from 1 GHz up to 15 GHz. The N15003A is fully compatible with the N1500A option 003 Resonant cavity software.
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