HIGHLIGHTS

Digital Coverage

  • The digital subsystem of the i1000D harnesses the simplicity and power from the industry-leading Medalist i3070 ICT, to bring customers the power to adjust test speeds, drive and receive voltages with just a few clicks of the mouse.

Complete Boundary Scan Capabilities

  • Putting even more ICT power in the hands of its users, Keysight has equipped the i1000 with full boundary scan capabilities, from Standard Boundary Scan and Connect test to Interconnect test.

Powerful Debug Interface

  • The digital debug GUI leverages the control and flexibility of the legendary i3070 PushButton debug GUI, allowing engineers and technicians to have full control of the digital test parameters and test source codes.

Low-Cost Fixturing

  • The Medalist i1000D runs digital tests using a traditional MDA-style longwired press down fixture. Boundary Scan tests, Serial Programming, Library-based tests all run without a glitch. Users now have a test solution that is simple and effective, and at the same time keep their operational costs down with the MDA-style fixtures.

The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.

With its new digital capabilities, the Medalist i1000D now can perform digital PCF/VCL library based testing, Boundary Scan and I2C/SPI serial programming on a simple, low-cost long-wired test fixture. This presents an excellent opportunity for customers who are looking for better test coverage without any increase in cost.

Principais especificações

Fixture Actuation
Press down
Max Node Count
3456
Max Parallel Testing
1
System Type
Offline System
System Width
1200 mm
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Press down
3456
1
Offline System
1200 mm
Visualizar mais
Fixture Actuation:
Press down
Max Node Count:
3456
Max Parallel Testing:
1
System Type:
Offline System
System Width:
1200 mm
U9401B Medalist i1000D

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