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Notas de Aplicação
Atomic force microscopy (AFM), a key member of the scanning probe microscopy (SPM) family, has developed into an invaluable tool of significant importance in many different areas of research and industry. Since its first development in 1986 [1] AFM has undergone much advancement, not only to extend measurement capabilities and to increase acquisition speed, but also to make the instrument more robust and user-friendly. Most commercial AFM systems today still use optical deflection detection to image samples of interest with nanometer resolution. Whereupon easy to handle and user-friendly self-sensing cantilevers are still mainly limited to home-built systems and special applications. Therefore SCL-Sensor.Tech. Fabrication in close collaboration with Keysight developed a hardware kit, making the benefits of user-friendly and easy to handle self-sensing cantilever technology available for Keysight AFM customers. In this application note a brief technical background of self-sensing cantilevers and the developed Converter Unit (CU) is introduced. Some representative images acquired with different modes of readout and excitation are also provided. In addition, the capability of using self-sensing cantilevers to image biological samples in different media including dry state, deionized water, physiological relevant buffer solutions, as well as non-transparent liquid are also demonstrated.
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