Improving Test Efficiency of MEMS Electrostatic Actuators

Notas de Aplicação

– Highly accurate and repeatable measurements

– DC bias function up to 40 V (Option 001)

– High-speed measurement, scanner interface (Option 301)

This application brief describes how the Keysight Technologies, Inc. E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

*Indicates required field

Change email? Email*Required Field

Nome*Required Field

Sobrenome* Required Field

Country / Area*Required Field

Empresa*Required Field

Industry*Required Field

Years of experience*Required Field

Job Level*Required Field

Job Responsibility*Required Field

Job Role*Required Field

Yes, keep me updated on the latest products, resources, and events with personalized email updates.

Would you like to speak to sales about your needs at this time? Not at this time Sim

*Required Field

Telefone*Required Field

Please have a sales representative contact me.

By clicking the button, you are providing Keysight with your personal data. See the Declaração de privacidade de Keysight Para obter informações sobre como usamos esses dados.

Thank you.

Your form has been successfully submitted.

Note: Clearing your browser cache will reset your access. To regain access to the content, simply sign up again.

*Indicates required field

*Required Field

Change email? Email

Telefone*Required FieldPlease enter a valid phone number without spaces or special characters.

Yes, keep me updated on the latest products, resources, and events with personalized email updates.

By clicking the button, you are providing Keysight with your personal data. See the Declaração de privacidade de Keysight Para obter informações sobre como usamos esses dados.

Thank you.

A sales representative will contact you soon.

O que você está procurando?

Bem-vindo

Improving Test Efficiency of MEMS Electrostatic Actuators

O que você está procurando?