Column Control DTX

Improving Test Efficiency of MEMS Electrostatic Actuators

Applikationsberichte

– Highly accurate and repeatable measurements

– DC bias function up to 40 V (Option 001)

– High-speed measurement, scanner interface (Option 301)

 

This application brief describes how the Keysight Technologies, Inc. E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

×

*Indicates required field

*Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight -Datenschutzaussage Informationen darüber, wie wir diese Daten verwenden.

Thank you.

A sales representative will contact you soon.

Column Control DTX