Choose a country or area to see content specific to your location
What are you looking for?
-
-
Integrated Physics Suite
Bridging design and physical testing to evaluate drop, impact, shock, and vibration compliance before hardware exists.
-
Buy an Expert Oscilloscope, Boost Your Bandwidth
Unlock your free upgrade to the next bandwidth tier.
-
End-to-End Validation for AI Data Center
Strengthen 1.6T network reliability for AI-scale workloads from transceivers to interconnects.
-
Take On Complex MIMO Signals
Pair Keysight VSA software with the new XA5 signal analyzer for advanced visualization, demodulation, and analysis — start your 30-day trial today.
-
Introducing AI-Enhanced Packet Brokers
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
-
Accelerate Semiconductor Innovation
Explore end-to-end workflows spanning IC design, validation, wafer test, and photonics.
-
Accelerate Your Innovation Engine
Explore curated support plans, prioritized to keep you innovating at speed.
-
448 Gb/s Waveform Generation
Achieve 200+ Gbaud multi-level modulated signals with high-speed AWGs for digital and optical standards.
-
The Right Connection Makes the Measurement
Maximize accuracy and performance with precision accessories engineered for Keysight instruments.
Analyze Complex RF Signals FasterExplore dual-channel and ultra-wideband signal analysis for demanding RF workflows.
Digital Validation. Faster.Get faster, clearer insights with our new multicore, 12-bit oscilloscope up to 33 GHz. Trade in your old oscilloscope and get credit toward a new XR8.
-
- Solutions
-
Authoritative application notes, data sheets, reference designs, and test procedures to accelerate design and validation decisions.
FeaturedHands‑on bootcamps that teach system design, test methods, and production workflows engineers can apply immediately.
Success Stories
HPE Juniper Networking Builds Next-Gen AI Infrastructure -
Quick access to support related self-help tasks.
Additional content to support your product needs.
Do more with Keysight ServicesExplore services to accelerate every step of your innovation journey.
- Overview
- All Models
- Accessories
- Software
- Support
Test Smart Card Security with Precision and Control
Smart cards, secure elements, and similar security-critical devices are designed to protect sensitive assets against both logical and physical attacks. Evaluating the effectiveness of these protections often requires the ability to inject precise and repeatable faults during security-critical operations. Smart Card Security Testing enables security engineers to assess device resilience against fault injection attacks, validate implemented countermeasures, and identify vulnerabilities before products reach the market.
Generate Precise Fault Conditions
Automate Security Evaluations
Validate Smart Card Countermeasures
Support Integrated Test Workflows
Combine fault injection hardware, triggering, automation, and analysis within a unified testing environment.
-
Product type
Smartcard voltage and clock glitcher
-
Input voltage range
-7.4 V to +4.2 V
-
Maximum voltage
8.5 V
-
Technology
Device Security
Most Popular Configurations
Smartcard Voltage and Clock Glitcher
Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable hardware.
Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable hardware.
Smartcard Voltage and Clock Glitcher
DS1160A
Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable hardware.
Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable pattern and control logic. The DS1160A has integrated circuitry for performing voltage and clock glitching and an output channel for controlling optical pulses on the DS1101A Fault Injection Laser System.
- Generate very short glitches using FPGA technology in the integrated digital pattern generator for very powerful tests
- Easily create any test scenario with the perturbation instruction set
- Reproduce tests with accurate logging of smartcard behavior
- Reduce testing time with automated testing of a large set of perturbation parameters
- Seamlessly integrate with DS1002A Pattern Based Trigger Generator and DS1101A Fault Injection Laser System
- Prevent card damage with adjustable current limiter
- Reach a high level of assurance with consistent and complete perturbation testing Does not require chip de-packaging
White Papers
From Classic Smartcards to Integrated Secure Elements
Understand critical factors that vendors need to consider when integrating Secure Elements in the System on Chip (SoC) to replace Classic Smartcards.
Services and support
Innovate at speed with curated support plans and prioritized response and turn-around times.
Get predictable, lease-based subscriptions and full lifecycle management solutions—so you reach your business goals faster.
Experience elevated service as a KeysightCare subscriber to get committed technical response and more.
Ensure your test system performs to specification and meets local and global standards.
Make measurements quickly with in-house, instructor-led training, and eLearning.
Download Keysight software or update your software to the newest version.
Frequently Asked Questions
Smart card security testing evaluates whether a smart card, secure element, or similar security-critical device can resist physical attacks such as fault injection and side-channel analysis. The goal is to identify vulnerabilities, validate security countermeasures, and improve device resilience before deployment.
Smart cards often store sensitive assets such as cryptographic keys, payment credentials, identity data, and authentication secrets. Because they protect high-value information, they are frequently evaluated against fault injection attacks designed to bypass security mechanisms or alter device behavior.
Fault injection deliberately introduces abnormal conditions into a smart card during operation. By disturbing power, clock signals, or other device parameters at precise moments, security engineers can investigate how the device responds and determine whether vulnerabilities can be exploited.
Many smart card operations occur extremely quickly. Nanosecond-level timing control allows evaluators to precisely target specific instructions, cryptographic calculations, or security checks, improving attack effectiveness and repeatability.
Yes. The DS1160A integrates with Inspector software to support automation, parameter exploration, campaign management, result analysis, and repeatable fault injection workflows.