Low-Cost, Digital-Capable In-Circuit Test

Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless. i1000D ICT redefines digital testing by bringing electronics manufacturers easy to use and affordable testing for digital devices.

The i1000D supports Cover Extend Technology (CET) with a NanoVTEP MUX card. If you are already using test fixtures with NanoVTEP MUX cards , you can implement CET without any fixture modification. Simply add new NanoVTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.

Mixed signal test mode is also available on the i1000D. Execute test strategies like digital to analog and analog to digital and combine both the analog and digital test sources into a single file. This allows you to easily see both test sources at the same time.

With its unique per pin programmable capability, the i1000D provides flexibility in supporting a new pin drive test mode. You can selectively control any digital resource on the tester for disabling or preconditioning pins. In short, the pin drive test mode gives you full control of the available digital drivers on the tester, without the need for a digital test library.

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