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Finding the problem in a complex interconnectlayout can be difficult and time consuming. Using state-of-the-art Vector Network Analyzers (VNAs) and new software packages offers breakthrough solutions for the digital designer
There is a great upside to bleeding-edge technology. That upside is the ability to do more, with less, faster and with less power. That upside, however, has baggage - complexity. High-speed digital designs are bumping up against RF fields, creating a new set of design issues. Tighter integration, three-dimensional devices and circuits, and multi-layer back planes, all packed denser than ever on physical real estate, have created a real challenge for digital design engineers. That translates into increasing difficulty for the designer to take direct measurements in today’s complex structures. Therefore the best solution is to characterize the device, in either the time or frequency domain (depending upon circumstances), with S-parameter measurements.
The first paper in this series was the introduction into working with and transforming general oscilloscope acquisitions. This is the second paper in this series and will discuss interconnect testing and present solutions based on the latest generation of test software (PLTS 2012) for Keysight Technology, Inc.’s line of performance network analyzers (PNAs). Specifically, it will address the new capabilities in the software.
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