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15 MSa/s, 1 pA/100 fA, 60 V, 3.5 A DC/10.5 A pulse
The PXIe precision SMU features a best-in-class narrow pulse width as narrow as 10 μs, a fast sampling rate of up to 15 MSa/s and a wide output range, enabling dynamic/pulsed measurements for broad emerging applications such as VCSEL optical devices and IC testing.
Narrow pulse and high sampling rate enable emerging dynamic/pulsed measurements
• Best-in-class narrow pulse width as low as 10 μs enables the measurement to suppress self-heating effects.
• Best in the industry high sampling rate of up to 15 MSa/s can capture dynamic behavior.
Broad coverage from low current to high current via a single module
• A wide output range of up to 60 V/3.5 A DC/10.5 A pulse enables flexible I/V measurement from DC to pulsed measurement
• Minimum 100 fA resolution with triaxial output ensures stable low current measurement
Faster throughput
• Low noise performance can shorten the measurement time for low current measurements of less than nA (as low as 400 fArms at 1 PLC)
• Seamless current measurement ranging eliminates the range change time
• M9602A and M9603A fully utilize PXIe advantages such as increased testing speed thanks to the PCIe bus speed and embedded PC controller
Typical Applications
• Optical devices which need fast dynamic and pulsed measurement capability to fully characterize their functionality such as a vertical cavity surface emitting laser (VCSEL) for 3D facial recognition and Light Detection and Ranging (LiDAR)
• Integrated circuit (IC) tests which need to cover a broader range of characteristics while in stand-by, sleep, and active modes such as RF front-end module (FEM)
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