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segmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generatorssegmentation:campaign/Quantum,segmentation:product-category/RF_Testing,segmentation:business-unit/CSG,keysight:product-lines/qb,segmentation:funnel/bofu,segmentation:product-category/RF_Testing/Quantum,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:models/q5/q5401a,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators
큐비트를 제어하고 읽어내는 방법
마이크로파 큐비트 제어 신호를 생성하고, 프로그래밍 가능한 펄스 시퀀스를 실행하며, 동기화된 큐비트 판독 및 측정 데이터 수집을 수행합니다.
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