詳細はこちら
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高インピーダンスノードのショートテストを高速化する方法
高インピーダンスノードを含む高密度プリント基板アセンブリのショートテストには、ノード間の多数のインピーダンス測定が必要です。強化されたショートテストアルゴリズムが、より高速で正確なショートテストをどのように実現するかをご覧ください。
詳細はこちら