Per saperne di più
keysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meterkeysight:product-lines/gm,segmentation:funnel/mofu,segmentation:business-unit/EISG,segmentation:campaign/Education,segmentation:product-category/DMMs_DAQs_Function_Generators/Digital_Multimeters,segmentation:product-category/DMMs_DAQs_Function_Generators,keysight:dtx/solutions/facets/development-area/software,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meter
Come caratterizzare un diodo
La caratterizzazione di un componente elettronico attivo come un diodo richiede che l'ingegnere addetto ai test esegua una misurazione della curva IV. Imparate a utilizzare i comuni strumenti da banco, come un alimentatore CC, un multimetro digitale e un software per eseguire un test di caratterizzazione dei diodi.
Per saperne di più