詳細はこちら
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C_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/InCircuit_Test_Systems,keysight:dtx/solutions/facets/industry/automotive,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:dtx/solutions/facets/design-and-test-product/board-test
MOLテストを用いたタクトタイムの最適化方法
プログラミング、バウンダリスキャン、機能試験、および最終検査といった、ますます複雑化する各工程におけるタクトタイムを最適化することで、自動車用PCBAの自動製造テストラインのバランスを調整します。これにより、タクトタイムを満たすように構築されたソリューションを通じて、スループットの向上と生産リソースのより効率的な活用が可能になります。
詳細はこちら