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P9001A Massively Parallel Parametric Test System
Keysight P9001A Massively Parallel Parametric Test System for fastest parametric test to accelerate Time-to-Market and lower Cost-of-Test.
スタート価格:
HIGHLIGHTS
- Notice for European Union Customers: A modified version of this non-RoHS compliant product has been made available to the European Union market, please contact your local Keysight Sales office for details. Keysight will maintain worldwide service and support of any P9001A test system throughout its support lifetime.
- The highest throughput parallel parametric test solution
- 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080
- Good data correlation with Keysight 4080
- True per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency)
- Easy development of parallel test plan
- Easy migration from 4080 environment
- Proven in 1st-tier logic foundries and memory companies
主な仕様
最大SPGU出力チャネル数
n/a
最大測定ピン数
100
最小電流測定分解能
0.1 fA
最小電流測定分解能
2 µV
Parallel Parametric Test Capability
はい
最大SPGU出力チャネル数
最大測定ピン数
最小電流測定分解能
最小電流測定分解能
Parallel Parametric Test Capability
n/a
100
0.1 fA
2 µV
はい
さらに表示
追加機能:
CV measurement
形状:
n/a
最大測定ピン数:
100
最大SPGU出力チャネル数:
n/a
最小電流測定分解能:
0.1 fA
最小電流測定分解能:
2 µV
Parallel Parametric Test Capability:
はい
タイプ:
Parametric Test Solution
Interested in a P9001A?
Extend the capabilities for your Massively Parallel Parametric Test System
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