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M6800B Test Development is a tool that is designed for test development purposes before sending to production for runtime usage. It provides a comprehensive scope of test development features, including:

• Configuration
• Data preparation
• Test generation
• Fixture generation
• Debug

M6801B Run time license for Boundary Scan Analyzer provides a comprehensive testing solution that fully complies with the latest IEEE 1149.1-2013 standard. This tool is designed specifically for production runtime testing, allowing you to perform accurate and reliable testing of your products before they are shipped to customers.

The M6802B tool provides a powerful capability to test the functionality of embedded instruments within a semiconductor device without the need to define the instruments or their features. By adding the necessary ICL and PDL files as libraries and assigning them to the relevant devices, the tool can automatically generate tests for devices compliant with the IEEE 1687 standard.

The M6803B tool provides a powerful capability to test the functionality of embedded instruments within a semiconductor device without the need to define the instruments or their features. By adding the necessary ICL and PDL files as libraries and assigning them to the relevant devices, the tool can automatically generate tests for devices compliant with the IEEE 1687 standard.

M6804B Result Analyzer is a powerful software tool designed to analyze the raw test results of devices and identify the specific device pin location responsible for a test failure. With its advanced analytical capabilities, this software can assist engineers in diagnosing and resolving issues quickly and effectively, leading to improved product quality and reduced manufacturing costs.

Software Version 2.0 Upgrade Plan for runtime and test development is a service that allows the user to get the latest software revisions for their Keysight x1149 Boundary Scan Analyzer.

The M6808B SVF tool allows you to program CPLD/FPGA devices easily by importing external source files. The tool supports multiple file formats, including STAPL, JAM, JBC, and SVF, making it a versatile solution for various programming needs.

Combining test and measurement expertise with data science and big data engineering, the PathWave Manufacturing Analytics platform provides actionable insights for every level in your organization in the smart factory of the future. Improve yield, lower retest and handling, and lower the cost of poor quality with big data advanced analytics that really works. Accelerate your Return on Investment and business outcomes with unique, innovative analytics.

Descriptive

• View your factory performance in terms of Overall Operating Efficiency (OEE), yield, first pass yield, retest, volume, etc. with extensive drilldowns and filters
• Save the workspace and see your own personalized dashboard on demand, real-time from anywhere

Diagnostic

• Use no-code specially curated diagnostic tools and visualizations for all levels of operators, technicians and engineers
• Root cause issues with just a few clicks, compare between multiple tests, systems, fixtures, parts, probes and more

 Predictive

• Predict potential quality issues in real-time manufacturing with optimized machine learning anomaly detection models
• Get only “high severity scored” alerts. Take action to prevent catastrophe and mitigate the risks of poor quality without alert fatigue

Prescriptive

• Prescribe real-time adaptive test limits with optimized dynamic part averaging testing
• Leverage transformed data and insights for horizontal and vertical systems to optimize processes

• Intelligent architecture - supports C/C++, VB, C#, VB.NET, Keysight VEE, and more
• Switch Manager - streamlines the task of switching topology configuration
• Test Profiler - evaluates and optimizes the performance throughput of individual tests
• Throughput Multiplier - increases throughput through batch testing for multiple UUTs
• Reusable library - provides framework for code reuse (handlers, actions, and test sequences)
• Multithreading – executes multiple test statements simultaneously
• Operating system Test Exec SL 8.1: Window® 10. Windows® 7 Professional or Home Edition, Service Pack 1 or later
• Operating system Test Exec SL 7.1: Windows® 7 32-bit or 64-bit Professional or Home Edition, Service Pack 1 or later. Windows® XP Professional or Home Edition, Service Pack 2 or later. Windows® 2000 Professional, Service Pack 4 or later

Keysight Technologies' TestExec SL is a customizable, flexible test executive developed specifically for electronics manufacturing functional test applications. This off-the-shelf test executive empowers test developers with a fully customizable operator interface, open architecture for multiple instrument integration, flexible test sequencing, easy debugging tools, and provisions for line integration in most manufacturing test environments. TestExec SL boosts productivity, offers unique advantages for test automation, and is unbeaten for ease of use. With the new release of TestExec SL 7.1, you can utilize the multithreading feature to improve execution throughput and reduce idle time.

User manual and help file for TestExec SL are available in the installation files.

Automate Testing with TestExec SL

• Intelligent architecture - supports C/C++, VB, C#, VB.NET, Keysight VEE, and more
• Switch Manager - streamlines the task of switching topology configuration
• Test Profiler - evaluates and optimizes the performance throughput of individual tests
• Throughput Multiplier - increases throughput through batch testing for multiple UUTs
• Reusable library - provides framework for code reuse (handlers, actions, and test sequences)
• Multithreading – executes multiple test statements simultaneously
• Asynchronous testing capabilities to better optimize test time and utilization

Keysight Technologies' TestExec SL is a customizable, flexible test executive developed specifically for electronics manufacturing functional test applications. This off-the-shelf test executive empowers test developers with a fully customizable operator interface, open architecture for multiple instrument integration, flexible test sequencing, easy debugging tools, and provisions for line integration in most manufacturing test environments. TestExec SL boosts productivity, offers unique advantages for test automation, and is unbeaten for ease of use.