This presentation illustrates unique design methodologies that help designers produce robust designs with high yield and first-pass success. This methodology eliminates design iterations, saves time and money, and enables companies to be first to market and gain a competitive edge.
Learn:
• Design of Experiments (DOE)
• Yield and Yield Sensitivity Histograms (YSH)
• Techniques to include both circuit and EM effects using ADS and RFPro
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