D9030DDRC DDR3 and LPDDR3 Compliance Test Application Software

D9030DDRC DDR3 and LPDDR3 Compliance Test Application Software

The Keysight Technologies, Inc. DDR3 and LPDDR3 compliance test application provides a fast and easy way to test, debug and characterize your DDR3 and LPDDR3 designs. The tests performed by the D9030DDRC software are based on the JEDEC DDR3 and LPDDR3 Specification. In addition, the application features Custom mode, which covers crucial measurements such as eye diagram, mask testing, ringing and other tests that are not covered in the specifications but are critical for characterizing DDR3 and LPDDR3 devices. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis.

Features

• Setup wizard for quick setup, configuration and test selection.

• Execution speed and proven test algorithm which minimizes test time.

• User-select tests and configuration based on the JEDEC DDR3 and LPDDR3 specification.

• Option to use phase difference or mixed signal oscilloscope read-write command trigger allowing for robust read and write data separation.

• Read and write cycle separation in real time mode for powerful debug and analysis.

• Ability to analyze the loading effect of adjacent rank of the same memory channel.

• DDR debug tool for navigation to areas of interest in a saved waveform with pre and post compliance testing capability.

• Test framework that reports multi trial results with full array of statistics for each measurement with worst case measurement result.

Comprehensive Test Coverage

The DDR3 and LPDDR3 compliance test application automatically configures the oscilloscope for each test and provides information test results which includes margin and statistical analysis. The tests coverage includes electrical, timing and eye diagram tests as stated in the JEDEC specification. The signal is optimized for most accurate test result and measurement repeatability. If you discover a problem with your device, the Custom mode feature and debug tool are available to aid in root-cause analysis.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing DDR3 and LPDDR3 devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. You have the option to use the conventional DQS-DQ phase difference or MSOV logic triggering (used only with MSOV series Infiniium oscilloscopes) for read and write data separation. You can select a category of tests or select an individual test. The user interface is designed to minimize unnecessary reconnections, which will help save test time and minimize potential operator error. You can save the tests and configurations as project files and recall them for quick testing and review previous results. You can also run the compliance test with saved waveform files from the oscilloscope or the ADS simulation tool on your PC, freeing the oscilloscope for other data acquisition purposes.

Configurability and Guided Connection

The DDR3 and LPDDR3 compliance test application provides flexibility in your test setup. The application lets you define controls for critical test parameters such as voltage threshold values, number of waveforms used for analysis and customizable violation settings. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected.

You can also specify the number of test trials and only stop running selected tests when the stop condition is met. The application will save the worst-case test result to help you track down the anomalies in your signals.