Column Control DTX
Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Notas de Aplicação

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

×

*Indicates required field

*Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Declaração de privacidade de Keysight Para obter informações sobre como usamos esses dados.

Thank you.

A sales representative will contact you soon.

Column Control DTX