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The Embedded Security Testbench provides a unified platform for executing advanced side-channel analysis and fault injection evaluations. Built on a scalable PXI architecture, it combines measurement, synchronization, triggering, and control capabilities within a single integrated environment, enabling security teams to perform complex testing workflows with greater precision and efficiency.
As embedded devices continue to increase in speed and complexity, security evaluations require tighter timing control, higher data throughput, and improved repeatability. The testbench addresses these challenges by providing a common foundation that synchronizes hardware, software, and instrumentation across the entire testing workflow. This allows engineers to capture measurements, generate triggers, coordinate digital interfaces, and execute security campaigns from a single platform.
The modular architecture enables organizations to start with the capabilities they need today and expand as testing requirements evolve. Whether supporting power analysis, electromagnetic analysis, or advanced security research, the platform adapts through configurable PXI modules that add triggering, waveform generation, and digital control without requiring changes to the core system.
Together, the DS1050A Embedded Security Testbench, DS1060A Pattern-Based Trigger Generator, DS1070A Glitch Pattern Generator, and DS1071A Digital I/O solution provide a flexible foundation for building repeatable, scalable, and future-ready device security test environments.
Bring measurement, synchronization, triggering, and control together within a single integrated platform.
Start with a focused configuration and expand capabilities through modular PXI instrumentation.
Coordinate measurements and security events with precise and repeatable timing across the entire test setup.
Support complex side-channel analysis and fault injection campaigns through synchronized hardware and software control.
Memory
64 GB
Product type
Embedded security testbench
Technology
Device Security
DS1050A
The Next Generation Embedded Security Testbench integrates modular, high-performance hardware for precise Side Channel Analysis and Fault Injection testing.
Leverage the high-speed PXIe architecture for faster, more precise security testing. The Next-Generation Embedded Security Testbench brings state-of-the-art PXI technology to Side Channel Analysis (SCA) and Fault Injection (FI) testing, offering unmatched performance, flexibility, and reliability. Designed for security professionals, this cutting-edge platform is built for the future, capable of reliably testing the most modern and high-speed targets.
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The Embedded Security Testbench is a unified platform for performing Side-Channel Analysis (SCA) and Fault Injection (FI) evaluations on embedded devices. It helps security engineers assess whether power, electromagnetic, timing, or other physical leakage can expose sensitive information, as well as whether induced faults can compromise device security or cryptographic implementations.
Side-channel evaluations often require multiple instruments working together with precise timing. A dedicated testbench helps synchronize measurements, triggers, and device interactions to improve repeatability, efficiency, and data quality.
Side-channel analysis is a passive technique that observes physical leakage, such as power consumption, electromagnetic emissions, or timing behavior, to infer sensitive information. Fault injection is an active technique that deliberately disturbs a device through voltage, clock, electromagnetic, or optical faults to induce abnormal behavior that may reveal vulnerabilities. The Embedded Security Testbench supports both methodologies within a single platform.
The DS1050A serves as the foundation of the platform, providing the PXI chassis and controller environment that integrates hardware modules, software, and instrumentation into a synchronized testing system.
Yes. The modular PXI architecture allows users to start with the capabilities they need today and add additional modules as testing requirements evolve.
No. The modular design allows you to begin with the DS1050A core platform and add the DS1060A Pattern-Based Trigger Generator, DS1070A Glitch Pattern Generator, or DS1071A Digital I/O module as your testing requirements grow.
The platform supports security evaluations across a wide range of embedded devices, including:
Synchronization ensures that measurements, triggers, and device activity occur in a coordinated manner. This improves trace alignment, reduces timing variation between measurements, and increases the accuracy and repeatability of side-channel analysis results.
PXI (PCI eXtensions for Instrumentation) is a modular test and measurement platform that allows multiple instruments to operate within a single synchronized system. Instead of connecting separate standalone instruments, PXI integrates triggering, control, data acquisition, and processing into a unified architecture.
For device security testing, this enables measurement modules, trigger generators, waveform generators, and digital I/O modules to work together with highly accurate timing and centralized control. The result is improved synchronization, greater repeatability, and the flexibility to expand the test environment as requirements evolve without replacing the core platform.
Yes. The platform is designed to support automated workflows, allowing users to execute repeatable experiments, automate complex test campaigns, and scale security evaluations across multiple devices and projects.
The Embedded Security Testbench serves as the central foundation of a device security testing environment. It synchronizes acquisition hardware, triggering systems, digital interfaces, and software tools, enabling engineers to perform repeatable Side-Channel Analysis and Fault Injection evaluations from a single integrated platform.