D9060GDDC GDDR6 Tx Compliance Test Software
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Test, Debug and Characterize Your GDDR6 Designs Quickly
The Keysight Technologies, Inc. D9060GDDC GDDR6 compliance test application provides a fast and easy way to test, debug and characterize your GDDR6 designs. The tests performed by the GDDR6 compliance test software are based on the JEDEC1 1836.99D Rev 3 (2019) GDDR6 SGRAM Specification. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis. GDDR6 represents an evolutionary upgrade to graphics memory systems with higher data rates while using less power than GDDR5. GDDR6 offers an attractive performance, performance trade-off for many Artificial Intelligence and high-performance computation systems. Signal integrity is crucial for memory system interoperability. Clock measurements help you ensure that the clocks are well within the specifications, which is the key to reliable and interoperable memory systems. At the same time, electrical and timing characteristics of signals are critical as well, to ensure the memory system functions correctly and stays error free. The D9060GDDC GDDR6 compliance test application is compatible with Keysight UXR and Z-Series Infiniium oscilloscopes.
Features
The GDDR6 compliance test application offers several features to simplify the validation of your GDDR6 designs:
• Setup wizard for quick setup, configuration and test
• Execution speed and proven test algorithm for clock test, which minimizes your compliance test time
• User-selected tests and configurations based on JEDEC JEDEC1 1836.99D Rev 3 (2019) GDDR6 SGRAM.
• Test framework provides powerful characterization through multiple trials that show a full array of statistics for each measurement and returns the worst measurement value
GDDR6 Test Reports
Comprehensive test coverage
With the GDDR6 compliance test application, you can use the same oscilloscope you use for everyday debugging to perform automated testing and margin analysis based on the JEDEC electrical and timing specifications. The application automatically configures the oscilloscope for each test and provides informative results. It includes margin analysis indicating how close your device comes to passing or failing the test for each specification. Some of the difficulties in performing the compliance tests are connecting to the target device, configuring the oscilloscope, performing the tests and analyzing the measured results. The GDDR6 compliance test application does most of this work for you.
Easy test definition
The test application enhances the usability of Keysight Infiniium oscilloscopes for testing GDDR6 devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. You can select a category of tests or specify individual tests. The user interface is designed to minimize unnecessary reconnections, which saves time and minimizes potential operator error. You can save the tests and configurations as project files and recall them later for quick testing and review of previous results.
Configurability and guided connection
The GDDR6 compliance test application provides flexibility in your test setup. The GDDR6 compliance test application provides you with user-defined controls for critical test parameters such as voltage threshold values, a single waveform is used for analysis and customizable violation settings. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected. With the multiple test trial capability, you can extensively characterize the performance of your GDDR6 devices. You can run the selected tests until the stop condition is met. The application will then save the worst-case conditions and help you track down the anomalies in your signals.
In addition to providing you with measurement results, the D9060GDDC GDDR6 compliance test application reports how close you are to the specified limit. You can specify the level at which warnings are to be issued. You are provided with a full array of statistics for each measurement, and you can save worst-case conditions to extensively test the performance of your device.