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Precision Current-Voltage Analyzers Series

Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.

Curve Tracer / Power Device Analyzer Series

The Keysight Curve Tracer / Power Device Analyzers are the best solutions for power device evaluation. Curve Tracers / Power Device Analyzers have wide voltage and current coverage options ranging from 3 kV / 20 A to 10 kV / 1500 A and other features that make them capable of handling all types of power devices. The Series provides a wide selection of curve tracers suitable to the needs of power device manufacturers and power electronics circuit / product manufacturers.

Find the Series That's Right for You

Precision Current-Voltage Analyzer

Precision Current-Voltage Analyzer

Precision current-voltage analyzers series ensure accurate current-voltage measurements with characterization across a wide range of IV applications.

Power Device Analyzer / Curve Tracer

Power Device Analyzer / Curve Tracer

Keysight power device analyzers provide wide voltage and current ranges that cover various power devices such as IGBT, super junction MOSFET, and so on.

Low-leakage Switch Matrix Mainframes, B2200A / B2201A / E5250A

Low-leakage Switch Matrix Mainframes, B2200A / B2201A / E5250A

Low-leakage switch mainframe solutions using a switching matrix with a semi-automatic or fully-automatic wafer prober to reduce cost of test.

Featured Resources

Technical Overviews 2023.03.28

B1500A Semiconductor Device Analyzer

B1500A Semiconductor Device Analyzer

This technical overview describes the complete device characterization solution covering measurement needs from basic IV and CV to ultra-fast pulsed and transient IV measurement using the B1500A semiconductor device analyzer.

2023.03.28

Application Notes 2023.01.02

IV and CV Measurement Using the B1500A MFCMU and SCUU

IV and CV Measurement Using the B1500A MFCMU and SCUU

This eight-page application note illustrates how an accurate IV and CV measurement system can be configured using the B1500A MFCMU and SCUU.

2023.01.02

Application Notes 2019.10.08

DC MOSFET Characterization at the Wafer Level

DC MOSFET Characterization at the Wafer Level

This application note discusses the use of the B1500A semiconductor device analyzer for ultra low current DC MOSFET characterization at the wafer level.

2019.10.08

Application Notes 2018.04.08

Accelerate the development of Next Generation Non-Volatile Memory

Accelerate the development of Next Generation Non-Volatile Memory

You can accelerate the development of next generation non volatile memory; CX3300 series for visualizing the fast switching characteristics, B1500A for basic IV,CV,pulsed IV and reliability testing.

2018.04.08

Case Studies 2022.11.08

Improving Reliability of Semiconductor Devices

Improving Reliability of Semiconductor Devices

Automation of random telegraph noise measurement (RTN) is now possible using the B1500A's waveform generator/fast measurement unit (WGFMU) module and WaferPro Express.

2022.11.08

Flyers 2014.07.30

Top 5 Reasons to Use Keysight Precision SMU Products for Solar Cell Evaluation

Top 5 Reasons to Use Keysight Precision SMU Products for Solar Cell Evaluation

This is a flyer targeting business opportunities for solar cells / modules and will be used by FEs and AEs generate business leads. Most of existing instrument products in HSTD are related to this flyer.

2014.07.30

Technical Overviews 2017.11.30

Challenges and Solutions for Material Science/Engineering Testing Applications

Challenges and Solutions for Material Science/Engineering Testing Applications

This technical overview introduces Keysight solutions for material science and engineering test applications.

2017.11.30

Success Stories

Case Studies 2022.11.08

Improving Reliability of Semiconductor Devices

Improving Reliability of Semiconductor Devices

Automation of random telegraph noise measurement (RTN) is now possible using the B1500A's waveform generator/fast measurement unit (WGFMU) module and WaferPro Express.

2022.11.08

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