How to Characterize Low-Power IC Inrush Current

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Modular Source Measure Unit
+ Modular Source Measure Unit
Modular Source Measure Unit
+ Modular Source Measure Unit

Capture Synchronized Power-On Transients Across a Wide Dynamic Range

Power-on characterization of a low-power integrated circuit (IC) requires a programmable supply, current measurement, and time-domain acquisition that can resolve the change from the pre-power state through the inrush event and subsequent rail settling. The supply is applied to the device under test (DUT) while the supply current is measured at the same time, with the acquisition triggered at the power-on event so the voltage and current waveforms share a common time reference.

The measurement captures the supply current over a wide dynamic range as the device moves from a low-current pre-power condition to a much higher inrush level and then settles toward its operating state. A high-speed digitizer can record the transient waveform, while voltage-source and current-limit settings control the applied rail. For multi-rail devices, additional channels can simultaneously monitor output voltages and other supply nodes.

Low-Power IC Inrush Current Test Solution

Apply the required supply voltage to the DUT while measuring the supply current and acquiring the transient waveform from the power-on event. The Keysight high-speed modular source/measure unit (SMU) provides digitizer acquisition up to 15 MSa/s, supporting time-domain capture of fast current changes. Its seamless current measurement ranging supports dynamic measurements across large changes in current without requiring a range change during the specified acquisition timing. In the application example, a PZ2131A modular SMU applies 5 V and measures supply current, showing a change from less than 100 μA before power-on to more than 750 mA of inrush current.
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How to Characterize Low-Power IC Inrush Current

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