Stress Testing Your Device with Simulated Waveforms
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Digital components and circuits must be able to withstand a certain amount of noise and jitter in clock and data signals to ensure the reliable operation of your device. If they do not, the result could be communication errors or system failures. Noise, jitter, cross talk, and reflections can cause signal distortions. Transient signal spikes can appear to be valid clocks, or the receiving system might misinterpret data. Such effects cause system failures. The design must minimize distortions to ensure accurate and reliable operation. Therefore, engineers need to stress their devices with these kinds of distortions during design, validation, and production. Stress testing provides valuable insight into the performance of your device under extreme load. Identifying the potential breaking points in your application will allow you to correct them before they become expensive production issues. Engineers must test the limits of their designs to ensure that the products achieve ideal maximum performance and the new hardware meets design specifications across the full range of operations. This white paper discusses the importance of stress testing and explains how to use a function generator to simulate the waveform and stress test your device.
