Stress Test Integrate Circuits (ICs) with a Function Generator
White Papers
This whitepaper provides a comprehensive guide on the methodology and importance of stress testing Integrated Circuits (ICs) using a function generator. Stress testing is a crucial process that ensures the reliability and performance of ICs under various conditions. The document covers the fundamental concepts of stress testing, the role and features of a function generator in this process, and detailed procedures for conducting effective stress tests. By following the outlined procedures, engineers can identify potential weaknesses in ICs and take necessary measures to enhance their durability and functionality. This white paper aims to equip test engineers with the knowledge and tools necessary to maintain the integrity of integrated circuits in their applications.