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Parametric Test Solutions Wafer-level test systems for parametric validation

Model: NX5402A

실리콘 포토닉스 웨이퍼 테스트 시스템

NX5402A 실리콘 광자 웨이퍼 테스트 시스템은 WAT 및 PCM 테스트를 위한 완벽히 자동화된 웨이퍼 프로버를 제공하며 대량 생산 환경에서 필요한 모든 기능을 지원합니다.

Additional features

One-pass optical & electrical test
Maximum number of measurement pins

12 (optical in), 12 (optical out), 30 (electrical)
Minimum voltage measurement resolution

N/A
최소 전류 측정 분해능

N/A

One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
Automated one pass testing for complex and massive optical and electrical measurements
Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
Dedicated support model enabling high system availability for production
Keysight-developed Fiber Alignment and Positioning System
Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
Reliable performance monitoring by Build-in Automatic System Diagnostics
Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode

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Ensure your test system performs to specification and meets local and global standards.

Make measurements quickly with in-house, instructor-led training, and eLearning.

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