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Authoritative application notes, data sheets, reference designs, and test procedures to accelerate design and validation decisions.
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Parametric Test Solutions Wafer-level test systems for parametric validation
Model: NX5402A
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Silicon Photonics Wafer Test System
NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.
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Additional features
One-pass optical & electrical test
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Maximum number of measurement pins
12 (optical in), 12 (optical out), 30 (electrical)
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Minimum voltage measurement resolution
N/A
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Minimum current measurement resolution
N/A
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