Highlights

  • One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
  • Automated one pass testing for complex and massive optical and electrical measurements
  • Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
  • High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
  • Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
  • Dedicated support model enabling high system availability for production
  • Keysight-developed Fiber Alignment and Positioning System
  • Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
  • Reliable performance monitoring by Build-in Automatic System Diagnostics
  • Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode

Key Specifications

Maximum Number of SPGU output channels
n/a
Maximum Number of Measurement Pins
12(optical in)+12(optical out), 30(electrical)
Minimum Current Measurement Resolution
n/a
Minimum Voltage Measurement Resolution
n/a
Parallel Parametric Test Capability
No
Maximum Number of SPGU output channels
Maximum Number of Measurement Pins
Minimum Current Measurement Resolution
Minimum Voltage Measurement Resolution
Parallel Parametric Test Capability
n/a
12(optical in)+12(optical out), 30(electrical)
n/a
n/a
No
View More
Additional Features:
n/a
Maximum Number of Measurement Pins:
12(optical in)+12(optical out), 30(electrical)
Maximum Number of SPGU output channels:
n/a
Minimum Current Measurement Resolution:
n/a
Minimum Voltage Measurement Resolution:
n/a
Parallel Parametric Test Capability:
No
Type:
Silicon Photonics Wafer Test Solution

Want help or have questions?