Impedance Measurement Handbook

Learn the basics of impedance measurements using Keysight LCR meters, impedance analyzers, and network analyzers. Explore impedance measurement techniques and tools.

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers

This application note covers calibration standard definitions, calibration kit content, and the structure requirements for Keysight's vector network analyzers.

Fundamentals of RF and Microwave Noise Figure Measurements

Explore information on RF and Microwave noise figure measurements, starting from the concept of noise figure and noise temperature, describing the noise characteristics of two-ports networks, and highlighting the different methods used to measure noise figure, such as Y-Factor and the Direct Noise measurement method.

Spectrum Analysis Basics (AN150)

Spectrum Analysis Basics teaches the fundamentals of spectrum analyzers and spectrum analysis including the latest advances in spectrum analyzer capabilities.

Time Domain Analysis Using a Network Analyzer

Time domain analysis is useful for impedance measurement and for evaluating a device problem. Learn how to apply the time domain display with network analyzers.

Advanced Design System (ADS) Circuit Design Cookbook 2.0

The ADS Circuit Design Cookbook provides getting started details of ADS software. The ADS circuit cookbook organizes the design work in the form of workspaces.

Understanding the Fundamental Principles of Vector Network Analysis

In this application note, the fundamental principles of vector network analysis will be reviewed. The discussion includes the common parameters that can be measured, including the concept of scattering parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

What is Frequency Response Analysis

Learn what frequency response analysis is and why it is so important with today’s electronics to ensure performance requirements are met.

How to Accurately Test and Characterize the Gate Charge (Qg) of SiC Devices

Gate charge is a necessary indicator in the dynamic parameter testing of power devices. However, achieving high precision and consistency in gate charge testing is challenging. This Application Note can help readers clearly understand the gate charge measurement methods for SiC MOSFET, ensuring the reliability and consistency.

Basics of Measuring the Dielectric Properties of Materials

The dielectric properties covered in this app note are permittivity and permeability. Read more about the fundamentals of dielectric property measurements.

The Power Handbook

De-Embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer

Explore the techniques of de-embedding and embedding S-parameter networks with a DUT. The error coefficients can be modified using the error-correcting algorithms of the VNA.

Basic Oscilloscope Fundamentals

Noise Figure Measurement Accuracy: The Y-Factor Method

This app note discusses the fundamentals of noise figure measurement using Y-factor method and how to avoid noise figure mistakes.

Spectrum and Signal Analyzer Measurements and Noise

Noise is the classical limitation of electronics. In this application note, the characteristics of noise and its direct measurement are discussed in detail.

Compute Express Link (CXL): A New Coherency Protocol Over PCIe

CXL Educational Application Note

Scienlab Charging Discovery System - Verification of Interoperability of all EV and EVSE Charging Interfaces

Learn more about the key functions of the Scienlab Charging Discovery System (CDS) from Keysight. This Application Note shows examples of failure analysis and test using the charging test solution. The CDS is a modular solution for conformance and interoperability testing of EV / EVSE charging interfaces.

Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers

This application note presents the technologies and methods for measuring permittivity and permeability. Learn more!

The Parametric Measurement Handbook - Edition 5

The 5th edition of Keysight’s Parametric Measurement Handbook is a complete parametric measurement reference, with information helpful for both novice and advanced users.

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR

Part 1 of a 2-part series explaining techniques in signal integrity analysis for those who use single-port TDR, TDR/TDT and 2-port TDR. Learn more.