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Silicon Photonics Wafer Test System

NX5402A Silicon Photonics Wafer Test System provides all required features for volume production testing such as WAT or PCM with a fully automated wafer prober.

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  • Additional features

    One-pass optical & electrical test

  • Maximum number of measurement pins

    12 (optical in), 12 (optical out), 30 (electrical)

  • Minimum voltage measurement resolution

    N/A

  • Minimum current measurement resolution

    N/A

Ready for a quote

Find out what's included and explore available upgrade options from Keysight.

Highlights

  • One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
  • Automated one pass testing for complex and massive optical and electrical measurements
  • Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
  • High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
  • Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
  • Dedicated support model enabling high system availability for production
  • Keysight-developed Fiber Alignment and Positioning System
  • Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
  • Reliable performance monitoring by Build-in Automatic System Diagnostics
  • Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode

Services and support