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segmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/33/33509b
기록된 과도 신호를 재현하는 방법
임의의 파형 생성을 통해 기록된 과도 신호를 재생하여 반복 가능한 소자 테스트를 수행하고, 타이밍, 오버슈트, 링잉 및 회복을 비교합니다.
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