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unnel/bofusegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:dtx/solutions/facets/industry/automotive,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:funnel/bofu
VCSEL 장치에 대한 LIV 테스트 수행 방법
VCSEL 디바이스의 LIV 테스트는 LIV 곡선을 생성하기 위해 주입 전류의 정밀한 제어와 광 출력 전력 측정을 필요로 합니다. 소스/측정 장치를 사용하여 다양한 작동 조건에서 VCSEL 디바이스에 대한 협폭 펄스 LIV 테스트를 수행하는 방법을 알아보십시오.
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