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segmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076b
클럭 복원을 이용한 고속 직렬 지터 측정 방법
피측정 장치(DUT)가 별도의 동기 클럭을 제공하지 않을 때 고속 직렬 지터를 측정합니다. NRZ 또는 PAM4 직렬 데이터에서 직접 타이밍을 복원하고, 복원된 클럭을 지터 및 아이(eye) 측정의 기준 신호로 사용합니다. 클럭 복원 루프의 대역폭과 피킹을 구성하여 타이밍 변동을 추적하는 방식을 제어하고, 지터 스펙트럼 분석을 통해 주파수 의존적 지터 성분을 조사합니다.
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