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Come eseguire misurazioni sincronizzate dei FET
Eseguire misurazioni sincronizzate sui transistor ad effetto di campo (FET) utilizzando due canali di precisione dell’unità di misura della sorgente (Source Measure Unit) per coordinare l’erogazione delle tensioni di gate e drain con la misurazione della corrente. Configurare scansioni sincronizzate, limiti di conformità, intervalli di misurazione, conteggi di trigger e ritardi di trigger per acquisire le caratteristiche Id-Vg dei FET.
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