How to Test High-Speed ADCs and DACs with Low-Noise RF Signals

Pro XG7 Analog Signal Generator
+ Pro XG7 Analog Signal Generator

Reduce Source Noise In Converter Measurements

High-speed analog-to-digital converter (ADC) and digital-to-analog converter (DAC) characterization requires RF sources with sufficient noise and spectral performance for the converter and measurement being evaluated. Configure the analog stimulus, clock-related source, or other applicable RF signal for the required frequency and level, then account for cables, filters, splitters, fixtures, and other elements between the source and converter.

Measure the converter output using instrumentation and analysis appropriate for the target metric, such as signal-to-noise ratio (SNR), signal-to-noise-and-distortion ratio, effective number of bits, or spurious-free dynamic range. Evaluate source phase noise, broadband noise, amplitude noise, harmonics, and spurious content as part of the complete test-system noise and distortion budget when interpreting converter performance.

Low-Noise Data Converter Test Solution

Characterize high-speed data converters using a controlled RF stimulus that minimizes noise and spectral artifacts relative to the behavior being measured. The solution provides a low-noise signal for evaluating ADC and DAC noise, distortion, and dynamic performance while helping separate source-related effects from converter-generated responses. Low phase noise supports measurements affected by sampling uncertainty, while low broadband noise helps preserve visibility into the converter noise floor. Low amplitude modulation (AM) noise, harmonics, and spurious content further reduce unwanted source contributions, helping engineers distinguish stimulus artifacts from converter behavior and achieve more representative measurements of the converter and overall test system.

See Block Diagram of Low-Noise Data Converter Test Solution

How to Test High-Speed ADCs and DACs with Low-Noise RF Signals Block Diagram

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