How to Test High-Speed ADCs and DACs with Low-Noise RF Signals

Pro XG7 Analog Signal Generator
+ Pro XG7 Analog Signal Generator

Reduce Source Noise In Converter Measurements

High-speed analog-to-digital converter (ADC) and digital-to-analog converter (DAC) characterization requires RF sources with sufficient noise and spectral performance for the converter and measurement being evaluated. Configure the analog stimulus, clock-related source, or other applicable RF signal for the required frequency and level, then account for cables, filters, splitters, fixtures, and other elements between the source and converter.

Measure the converter output using instrumentation and analysis appropriate for the target metric, such as signal-to-noise ratio (SNR), signal-to-noise-and-distortion ratio, effective number of bits, or spurious-free dynamic range. Evaluate source phase noise, broadband noise, amplitude noise, harmonics, and spurious content as part of the complete test-system noise and distortion budget when interpreting converter performance.

Low-Noise Data Converter Test Solution

Characterize high-speed data converters with an RF source whose noise and spectral artifacts remain sufficiently below the behavior you need to measure. The Keysight SG6311A Pro XG7 analog signal generator provides a low-noise RF stimulus that helps reduce source contributions when evaluating analog-to-digital converter (ADC) and digital-to-analog converter (DAC) noise, distortion, and dynamic performance. Low phase noise supports measurements sensitive to sampling uncertainty, while low broadband noise helps preserve visibility into the converter noise floor. Low amplitude modulation noise, harmonics, and spurious content also help you distinguish source artifacts from converter-generated responses, providing greater confidence that the measurement reflects the converter and complete test system rather than unnecessary limitations from the RF source.

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How to Test High-Speed ADCs and DACs with Low-Noise RF Signals Block Diagram

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