Highlights

Access Multiple Measurement Instruments in One Semiconductor Device Analyzer for all Your Semiconductor Testing Needs

The Keysight B1500A semiconductor parameter analyzer is an all-in-one device characterization analyzer designed for comprehensive semiconductor testing. This versatile instrument supports various measurement techniques, including IV, CV, pulse/dynamic IV, and more, making it an ideal choice for semiconductor testing applications. The mainframe and plug-in modules offer unmatched flexibility, enabling the characterization of various electronic devices, materials, semiconductors, active/passive components, and more.

With its primary focus on semiconductor testing, the B1500A ensures uncompromised measurement reliability and efficiency during electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device. The B1500A's modular architecture also allows for easy upgrades when needed, making it a valuable tool for semiconductor testing and evaluation.

  • Switch between CV and IV measurements without re-cabling
  • Capture ultra-fast transient phenomena not possible with other conventional test instruments
  • Detect multi-frequency AC capacitance measurements from a range of 1 kHz to 5 MHz
  • Analyze data without an external PC using the intuitive 15-inch touch screen interface
  • Configure the B1500A with your choice of measurement modules, up to 10 slots in a box
  • Enjoy the 15-inch wide touch screen with intuitive EasyEXPERT group+ software

Why Buy From Us?

World-class measurement capabilities

Characterize your device/material with confidence

With a minimum of 0.5 V and 0.1 fA resolution, the B1500A is considered the superior low voltage and current measurement tool. It also has a pulsed IV measurement rate of 100 nanoseconds and a sampling rate of 5 nanoseconds with no load-line effect.

One-box Complete Solution

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A complete solution that covers all your basic semiconductor testing and device characterization needs

The B1500A supports everything from fundamental current-voltage (I/V) and capacitance-voltage (CV) characterization to ultra-fast pulsed IV testing. It has flexible and upgradeable modules with up to ten slots for future measurement needs. The B1500A is a one-box solution with touchscreen functionality that runs on the Windows platform.

Best-in-class softwarE

Device Benchmark Toolset

Simplifies your device characterization with EasyEXPERT group+

The B1500A, designed for semiconductor testing, includes software with over 300 ready-to-use application tests that allow you to perform a measurement in just three simple steps. You can improve test efficiency for semiconductor testing by automating graphical display, analysis, and parameter extraction. It also provides easy switching matrix control and automated testing with semi-automatic wafer probers, making it a valuable tool for semiconductor testing applications.

Cost-effective

Cost Reduction

Get versatile measurement capabilities at a lower cost

  • If you are a researcher or educator, look no further; buy now and save 30% on the B1500A mainframe.
  • If you are in charge of advanced NVM evaluations such as ReRAM, PCRAM, and FeRAM, save 15% on B1500A in advanced NVM test configurations.
  • If you are interested in automated Random Telegraph Noise (RTN) measurements on a wafer, you can perform them at a low cost with the W7801B WGFMU Measurement Bundle Software.

Key Specifications

Max Output Coverage

200 V / 1 A

Max SMU Channels

10

Connector Type

Active guard triaxial

Min Measure Resolution

0.1 fA / 0.5 µV

Connectivity

GPIB, USB, LAN, VGA

Want to see more specifications?

Device Characterization in 3 Steps

Use the included EasyEXPERT group+ characterization software on the B1500A semiconductor parameter analyzer or your PC. EasyEXPERT group+ includes over 300 ready-to-use application tests, which allow you to make a measurement in three easy steps:

Step 1: Select a measurement from one of the built-in libraries

Step 2: Modify measurement parameters and save customizations in your favorites

Step 3: Press the measure button and the results display graphically

Featured Semiconductor Device Analyzer Resources

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