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Device Manufacturing Test Platforms
Industry-proven platform for multi-device and multi-format non-signaling manufacturing test in a single compact configuration

Keysight’s 5G wireless test platforms are modular and scalable, enabling testing via a range of methods and frequencies. They comprise the following key building blocks:
- E6640A Wireless Test Set
- Cellular (5G, LTE, etc.) and Wi-Fi (802.11ax, ac, etc.) in a single compact solution
- Cost-effective multi-device and multi-format non-signaling manufacturing test
- State-of-the-art automation and fast sequencing for high volume production with PathWave Test Automation
- Supports 5G NR in both non-standalone (NSA) and standalone (SA) modes
- Up to four independent TRX channels per EXM
- Independent source and analyzer on each TRX enables efficient use of test resources
- Cellular: 5G, LTE/LTE-Advanced FDD, LTE/LTE-Advanced TDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000®, GSM/EDGE-Evo, TD-SCDMA, DECT and PHS
- Connectivity: 802.11a/b/g/n/j/p/ac/af/ah/ax, WLAN MIMO 2x2/3x3/4x4, Bluetooth® 5.0, multi-satellite GNSS, FM, Zigbee, Z-Wave, and digital video
- E6680A Wireless Test Set
- 200, 400 or 800 MHz bandwidth
- 380 MHz to 7.3 GHz frequency range
- IEEE 802.11a/b/g/j/p/n/ac/af/ah/ax, Bluetooth 5.1, 802.15.4, 5G NR, 4G
- Up to 4096QAM
- MU-MIMO and OFDMA with statistics and RF performance for each user
- Up to 4x4 MIMO and 8x8 switched MIMO
- Power, transmit spectral mask, spectral flatness, EVM measurements and analysis
- E6681A EXM-WB Wireless Test Set
- 300, 600, or 1.2 GHz bandwidth
- 5G NR and optional mmWave antenna characterization software applications
- Chipset control, sequence analyzer, source list, and parallel test
- Power, SEM, ACLR, EVM, and more measurements and analysis
- E7760B Wideband Transceiver for 5G
- Reduce system complexity with a single compact solution covering IF and multiple mmWave bands for both transmit and receive paths
- Characterize module performance over-the-air with seamless integration with Keysight OTA chambers
- Simultaneous signal generation and analysis with independent frequency and power
- Two bi-directional IF ports
- Six RF ports for multiple device testing
- E7770A Common Interface Unit
- Supports high IF (6-12 GHz) conducted connections by upconverting the UXM 5G RF output
- Provides the Local Oscillators, Power and Control to the M1740A mmWave transceivers
- Supports up to 8x M1740A mmWave transceivers, for multiple angle-of-arrival (AoA) testing
- M1740A mmWave Transceiver for 5G
- Supports 28, 39 and 40 GHz bands in a single compact, bi-directional unit
- Mounted on the OTA test chamber to minimize RF path loss
See the links below for further details about each of these instruments.
Explore the Device Manufacturing Test Platforms

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