Semiconductor Parametric Characterization Basic Training - Part 2
- Courses
- 12 items
Gain expert-level skills in device characterization with this focused bootcamp. Through video lessons, application notes, and Keysight’s trusted handbook, you’ll learn to extract critical parameters—from capacitance and gate charge to ultra-low resistance—using industry-standard methods and tools.
Learn:
- Capacitance measurement fundamentals (quasi-static vs. high-frequency CV) for device analysis.
- Integrated CV-IV solutions to streamline testing workflows.
- JEDEC-compliant gate charge measurement for Si/SiC/GaN power devices.
- Precision techniques for ultra-low on-resistance (Rds-on) in SiC MOSFETs.
- Test automation with the Digital Learning Suite for labs and education.
This bootcamp is ideal for device characterization engineers, power semiconductor researchers, and educators seeking hands-on parametric testing skills.
Lessons
