Learn the basics of capacitance measurement for semiconductor parametric test. Practical capacitance measurement issues and how to avoid common mistakes will be covered.
Lesson 1 - Capacitance in Semiconductor Devices
Discusses different types of capacitance measurement (quasi-static CV and high-frequency CV) and shows what types of device parameters they can reveal. Practical capacitance measurement issues are also addressed.
Lesson 2 - Capacitance Measurement Methods
Defines capacitance measurement methods and the different types of capacitance meters. The best method for measuring capacitance will depend on the specific application.
Lesson 3 - Quasi-Static Capacitance Measurement
Explains quasi-static capacitance measurement and why quasi-static measurement is important. It's important to understand that it's a device response and accuracy depends on the characteristics of the measurement process.
Lesson 4 - High-Frequency Capacitance Measurement
Provides a focused explanation of High-Frequency Capacitance Measurement.
Lesson 5 - Components Required to Create a Total CV-IV Measurement Solution
Shares the components necessary to create a total CV-IV measurement solution. Ideally, the goal is to be able to do a complete CV and IV on a single instrument or set-up.
Lesson 6 - Summary and Additional Resources
Summarizes how essential capacitance measurement is for device parametric characterization and offers additional resources for more information.
The Parametric Measurement
The question as to what constitutes parametric testing is an interesting one and is possibly open to some debate. In general, parametric testing involves the electrical testing and characterization of four main types of semiconductor devices: resistors, diodes, transistors, and capacitors. This App Note enables engineers and researchers to make accurate parametric measurements on low and high power devices both now and for many years into the future.