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ation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532a
임의의 파형을 생성, 캡처 및 검증하는 방법
사용자 정의 임의 파형을 생성하고, 트리거 방식의 디지털화 기능을 위해 디지털 멀티미터를 설정한 다음, 파형 이벤트를 캡처하고, 계측기 디스플레이에서 직접 결과를 확인합니다. 이 벤치 워크플로는 임의 파형 생성, 파형 캡처, 트리거 방식의 데이터 수집 및 파형 검증을 반복 가능한 기능 테스트에 통합합니다.
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