詳細はこちら
segmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/Network_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireless-communications,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/network-analyzer,keysight:models/n5/n5224b
治具内でのVNA測定を正確に行う方法
フィクスチャ内ベクトルネットワークアナライザ(VNA)測定では、被測定デバイス(DUT)をアナライザのテストポートに直接接続するのではなく、テストフィクスチャを介して接続します。測定セットアップは、ベクトルネットワークアナライザ、校正済みのテストケーブル、フィクスチャインターフェース、および再現性のあるDUT接続で構成されます。 手順は、アクセス可能な測定基準面での校正から始まり、続いてフィクスチャの特性評価を行い、適切な誤差補正またはデエンベディング手法を適用します。その後、エンジニアは、テストフィクスチャによって生じる電気的影響を考慮しつつ、必要な周波数範囲にわたってDUTの散乱パラメータ(Sパラメータ)を測定し、挿入損失、反射損失、およびその他の関連するRF特性を評価します。
詳細はこちら